Test generation : a hierarchical approach
                                            statement of authorship
                                    
                                    
G.Jervan, R.Ubar, Z.Peng, P.Eles
                                                    
                                            
                                            location of publication
                                    
                                    
London
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 67-81 : ill
                                                    
                                            
                                            ISBN
                                    
                                    
1-85233-899-7
                                                    
                                            
                                            notes
                                    
                                    
(Advanced microelectronics, ISSN 1437-0387 ; 17). Bibliogr.: 18 ref
                                                    
                                            
                            Jervan, G., Ubar, R.-J., Peng, Z., Eles, P. Test generation : a hierarchical approach // System-level test and validation of hardware/software systems. London : Springer, 2005. p. 67-81 : ill.