XPS study of OH impurity in solution processed CdS thin films
                                            statement of authorship
                                    
                                    
Natalia Maticiuc, Atanas Katerski, Mati Danilson, Malle Krunks, Jaan Hiie
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            journal volume number month
                                    
                                    
vol. 160
                                                    
                                            
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 211-216 : ill
                                                    
                                            
                                            ISSN
                                    
                                    
0927-0248
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 34 ref
                                                    
                                            
                                            scientific publication
                                    
                                    
teaduspublikatsioon
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                                            keyword
                                    
                                    
CdS thin film
                                                    
                                                    
                                                    
hydroxide incorporation
                                                    
                                                    
                                                    
mechanism of changes in CdS properties
                                                    
                                            
                                            classifier
                                    
                                    
                                
                                            quartile
                                    
                                    
                                
                                            TalTech department
                                    
                                    
                                
                                    Maticiuc, N., Katerski, A., Danilson, M., Krunks, M., Hiie, J. XPS study of OH impurity in solution processed CdS thin films // Solar energy materials and solar cells (2017) vol. 160, p. 211-216 : ill.  https://doi.org/10.1016/j.solmat.2016.10.040