print

Test generation for sequential digital systems based on symbolic simulation

author
Skobtsov, Vadim
Skobtsov, Yu.
statement of authorship
V.Skobtsov, Yu.Skobtsov
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 341-344: ill
ISBN
9985-59-081-3
notes
Bibl. 7 ref
Skobtsov, V., Skobtsov, Yu. Test generation for sequential digital systems based on symbolic simulation // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 341-344: ill.