Measurement of the lifetime of nonequilibrium charge carriers in silicon using photoelectric methods
statement of authorship
Aleksander Graf, Aleksei Gavrilov, Pavel Suurvarik
journal volume number month
Vol. 6, 4
year of publication
pages
p. 26-31 : ill
ISSN
2305-8269
notes
Bibliogr.: 2 ref
language
inglise
subject term
keyword
methods of measuring
nonequilibrium charge carriers
lifetime of carriers
TTÜ department
Graf, A., Gavrilov, A., Suurvarik, P. Measurement of the lifetime of nonequilibrium charge carriers in silicon using photoelectric methods // International journal of engineering and applied sciences (EAAS) (2015) Vol. 6, 4, p. 26-31 : ill.