Macro level defect-oriented diagnosability of digital circuits
statement of authorship
Sergei Kostin, Raimund Ubar, Jaan Raik
location of publication
[Tallinn]
publisher
year of publication
pages
p. 149-152 : ill
conference name, date
12th Biennial Baltic Electronics Conference, 2010
conference location
Tallinn
ISSN
1736-3705
ISBN
978-1-4244-7357-1
notes
Bibliogr.: 18 ref
TalTech department
language
inglise
Kostin, S., Ubar, R., Raik, J. Macro level defect-oriented diagnosability of digital circuits // BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia. [Tallinn] : Tallinn University of Technology, 2010. p. 149-152 : ill.