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Top-K formal concepts for identifying positively and negatively correlated biclusters

author
statement of authorship
Amina Houari & Sadok Ben Yahia
source
location of publication
Cham
publisher
year of publication
pages
p. 156-172
series
conference name, date
10th International Conference, MEDI 2021, Tallinn, Estonia, June 21-23, 2021
conference location
Virtual Conference
url
ISSN
0302-9743
1611-3349
ISBN
978-3-030-78427-0
978-3-030-78428-7
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
Reserch Group
Data science group
Houari, A., Ben Yahia, S. Top-K formal concepts for identifying positively and negatively correlated biclusters // Model and Data Engineering : 10th International Conference, MEDI 2021, Tallinn, Estonia, June 21–23, 2021 : proceedings. Cham : Springer Nature, 2021. p. 156-172. (Lecture notes in computer science ; 12732). https://doi.org/10.1007/978-3-030-78428-7_13