Ubar, R.-J., Mazurova, N., Smahtina, J., Orasson, E., Raik, J.

full record print

HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systems

author

Ubar, Raimund-Johannes

Mazurova, Natalja

Smahtina, Julia

Orasson, Elmet

Raik, Jaan

statement of authorship

R.Ubar, N.Mazurova, J.Smahtina, E.Orasson, J.Raik

source

Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004

location of publication

[S. l.]

year of publication

2004

pages

p. 497-502 : ill

ISBN

83-919289-7-7

notes

Bibliogr.: 22 ref

Ubar, R.-J., Mazurova, N., Smahtina, J., Orasson, E., Raik, J. HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systems // Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004. [S. l.], 2004. p. 497-502 : ill.