HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systems
statement of authorship
R.Ubar, N.Mazurova, J.Smahtina, E.Orasson, J.Raik
location of publication
[S. l.]
year of publication
pages
p. 497-502 : ill
ISBN
83-919289-7-7
notes
Bibliogr.: 22 ref
Ubar, R.-J., Mazurova, N., Smahtina, J., Orasson, E., Raik, J. HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systems // Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004. [S. l.], 2004. p. 497-502 : ill.