Blyzniuk, M., Cibakova, T., Gramatova, E., Kuzmicz, W., Lobur, M., Pleskacz, W., Raik, J., Ubar, R.

Defect oriented fault coverage of 100stuck-at fault test sets

author

Blyzniuk, M.

Cibakova, Tatiana

Gramatova, Elena

Kuzmicz, W.

Lobur, M.

Pleskacz, Witold A.

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

M.Blyzniuk, T.Cibakova, E.Gramatova, W.Kuzmicz, M.Lobur, W.Pleskacz, J.Raik, R.Ubar

source

Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000

location of publication

[S. l.]

year of publication

2000

pages

p. 511-516 : ill

ISBN

83-87202-37-1

notes

Bibliogr.: 12 ref

Blyzniuk, M., Cibakova, T., Gramatova, E., Kuzmicz, W., Lobur, M., Pleskacz, W., Raik, J., Ubar, R. Defect oriented fault coverage of 100stuck-at fault test sets // Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000. [S. l.], 2000. p. 511-516 : ill.