Aleksejev, I., Jutman, A., Devadze, S. - TalTech Research Portal

Run-time reconfigurable instruments for advanced board-level testing

author

Aleksejev, Igor

Jutman, Artur

Devadze, Sergei

statement of authorship

Igor Aleksejev, Artur Jutman, Sergei Devadze

source

IEEE instrumentation & measurement magazine

journal volume number month

vol. 20, 4

year of publication

2017

pages

p. 23-30 : ill

url

https://doi.org/10.1109/MIM.2017.8006390

subject term

testimine

manussüsteemid

programmeerimine

keyword

field programmable gate arrays

test equipment

ISSN

1094-6969

notes

Bibliogr.: 14 ref

TTÜ department

arvutisüsteemide instituut

language

inglise

Aleksejev, I., Jutman, A., Devadze, S. Run-time reconfigurable instruments for advanced board-level testing // IEEE instrumentation & measurement magazine (2017) vol. 20, 4, p. 23-30 : ill. https://doi.org/10.1109/MIM.2017.8006390