Pattern based analysis of fractal manufacturing systems [Electronic resource]
author
statement of authorship
K. Jääger, J. Vain
source
INCOM 2004 : 11th IFAC Symposium on Information Control Problems in Manufacturing : Salvador, Brasil, April 5-7, 2004 : preprints proceedings
location of publication
[S.l.]
publisher
Gulf Professional Publishing
year of publication
pages
[6] p. [CD-ROM]
conference name, date
11th IFAC Symposium on Information Control Problems in Manufacturing, April 5-7, 2004
conference location
Salvador, Brasil
language
inglise
subject term
Jääger, K., Vain, J. Pattern based analysis of fractal manufacturing systems [Electronic resource] // INCOM 2004 : 11th IFAC Symposium on Information Control Problems in Manufacturing : Salvador, Brasil, April 5-7, 2004 : preprints proceedings. [S.l.] : Gulf Professional Publishing, 2005. [6] p. [CD-ROM].