Analysis and improvement of resilience for long short-term memory neural networks
statement of authorship
Mohammad Hasan Ahmadilivani, Jaan Raik, Masoud Daneshtalab, Alar Kuusik
publisher
year of publication
pages
4 p
conference name, date
36th IEEE InternationalSymposium on Defect andFault Tolerancein VLSIandNanotechnology Systems (DFT), 3-5 October 2023
conference location
Juan-les-Pins, France
ISSN
2765-933X
ISBN
979-8-3503-1500-4
notes
Bibliogr.: 12 ref
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
subject term
keyword
fault tolerant systems
discrete Fourier transforms
long short term memory
classifier
Ahmadilivani, M. H., Raik, J., Daneshtalab, M., Kuusik, A. Analysis and improvement of resilience for long short-term memory neural networks // 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). : IEEE, 2023. 4 p.