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Fast and efficient static compaction of test sequences based on greedy algorithms

author
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
J.Raik, A.Jutman, R.Ubar
source
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
location of publication
[S. l.]
year of publication
2001
pages
p. 117-122
ISBN
963 7175 16 4
notes
Bibliogr.: 13 ref
Raik, J., Jutman, A., Ubar, R. Fast and efficient static compaction of test sequences based on greedy algorithms // IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001. [S. l.], 2001. p. 117-122.