Raik, J., Jutman, A., Ubar, R. - TalTech Research Portal

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Fast and efficient static compaction of test sequences based on greedy algorithms

author

Raik, Jaan

Jutman, Artur

Ubar, Raimund-Johannes

statement of authorship

J.Raik, A.Jutman, R.Ubar

source

IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001

location of publication

[S. l.]

year of publication

2001

pages

p. 117-122

ISBN

963 7175 16 4

notes

Bibliogr.: 13 ref

Raik, J., Jutman, A., Ubar, R. Fast and efficient static compaction of test sequences based on greedy algorithms // IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001. [S. l.], 2001. p. 117-122.