Assembling low-level tests to high-level symbolic test frames
statement of authorship
G.Jervan, A.Markus, J.Raik, R.Ubar
location of publication
[Copenhagen]
year of publication
pages
p. 275-280: ill
notes
Tiitellehel: ... 15th NORCHIP Seminar. Bibl. 6 ref
language
inglise
Jervan, G., Markus, A., Raik, J., Ubar, R. Assembling low-level tests to high-level symbolic test frames // Proceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 1997. [Copenhagen], 1997. p. 275-280: ill.