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Design error diagnosis with re-synthesis in combinational circuits

author
Ubar, Raimund-Johannes
statement of authorship
Raimund Ubar
source
Journal of electronic testing : theory and applications
journal volume number month
Volume 19
year of publication
2003
pages
1, p. 73-82 : ill
url
https://link.springer.com/article/10.1023/A:1021948013402
subject term
disain
rikked
diagnostika (tehnika)
simulatsioon
VLSI-ahelad
ISSN
0923-8174
notes
Bibliogr.: 16 ref
language
inglise
Ubar, R.-J. Design error diagnosis with re-synthesis in combinational circuits // Journal of electronic testing : theory and applications (2003) Volume 19, 1, p. 73-82 : ill. https://link.springer.com/article/10.1023/A:1021948013402