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VLSI-ahelad (subject term)
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1
book article
A VLSI implementation of RSA and IDEA encryption engine
Buldas, Ahto
;
Põldre, Jüri
Proceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 1997
1997
/
p. 281-288: ill
book article
2
dissertation
At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemidele
Gorev, Maksim
2015
https://digi.lib.ttu.ee/i/?3953
dissertation
3
book article
Automatic test generation system for VLSI
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
1997
/
p. 255-258
book article
4
book article
CAD of CCD VLSI
Zaycev, S.N.
;
Kanunnikov, A.I.
;
Pugachev, A.A.
;
Shilin, V.A.
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University
1992
/
p. 120-122: ill
book article
5
dissertation
Control intensive digital system synthesis
Tammemäe, Kalle
1997
http://www.ester.ee/record=b1060033*est
dissertation
6
book article
DeepHLS: A complete toolchain for automatic synthesis of deep neural networks to FPGA
Riazati, Mohammad
;
Daneshtalab, Masoud
;
Sjodin, Mikael
;
Lisper, Bjorn
ICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, November 23-25, 2020, Virtual Conference : Proceedings
2020
/
4 p
https://doi.org/10.1109/ICECS49266.2020.9294881
book article
7
book article
Defect-oriented BIST quality analysis
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Raik, Jaan
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 153-156 : ill
book article
8
dissertation
Dependability improvements of NoC-based systems = Töökindluse parandamine kiipvõrkudel põhinevates süsteemides
Niazmand, Behrad
2018
https://digi.lib.ttu.ee/i/?9879
https://www.ester.ee/record=b4907650*est
dissertation
9
journal article
Design error diagnosis with re-synthesis in combinational circuits
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2003
/
1, p. 73-82 : ill
https://link.springer.com/article/10.1023/A:1021948013402
journal article
10
book article
Design obfuscation versus test
Farahmandi, Farimah
;
Sinanoglu, Ozgur
;
Blanton, Ronald
;
Pagliarini, Samuel Nascimento
2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia
2020
/
10 p
https://doi.org/10.1109/ETS48528.2020.9131590
book article
11
book article
Design space exploration and optimisation for NoC-based timing sensitive systems
Tagel, Mihkel
;
Ellervee, Peeter
;
Jervan, Gert
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 177-180 : ill
book article
12
book article
Digital logic simulation with compressed BDDs
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Devadze, Sergei
;
Raik, Jaan
Proceedings : 2011 IEEE International Conference on Computer Science and Automation Engineering : June 10-12, 2011, Shanghai, China
2011
/
p. 105-109 : ill
https://ieeexplore.ieee.org/document/5952643
book article
13
dissertation
Digital test in WEB-based environment
Ivask, Eero
2006
https://www.ester.ee/record=b2158119*est
dissertation
14
book article
Fault diagnosis of VLSI devices using alternative graph representation
Ubar, Raimund-Johannes
Proceedings of the 8th Symposium on Microcomputer and Microprocessor Applications, Budapest, October 12-14, 1994. Vol. 1
1994
/
p. 34-44
book article
15
book article
Functional test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
;
Jutman, Artur
;
Raik, Jaan
;
Bengtsson, Tomas
;
Kumar, Shashi
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 205-208 : ill
book article
16
book article
Graph embedding in boolean hypercube
Fomina, Jelena
;
Zakrevskij, Arkadij
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 131-134 : ill
book article
17
dissertation
High-level synthesis of control and memory intensive applications : thesis submitted to the Royal Institute of Technology in partial fulfillment of the requirements for the degree of Doctor of Technology
Ellervee, Peeter
2000
dissertation
18
dissertation
Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseks
Orasson, Elmet
2007
https://www.ester.ee/record=b2305436*est
dissertation
19
book article
Multi-level test generation and fault diagnosis for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
Dependable computing : proceedings / EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 1996
1996
/
p. 264-281: ill
book article
20
book article
On SSBDD model size & complexity
Jutman, Artur
ECS'03 : proceedings of the 4th Electronic Circuits and Systems Conference : September 11-12, 2003, Bratislava, Slovakia
2003
/
p. 17-22
https://pld.ttu.ee/~artur/papers/SSBDD_Model_Size-ECS03.pdf
book article
21
dissertation
Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemides
Kruus, Helena
2011
dissertation
22
journal article
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
Blyzniuk, M.
;
Kazymyra, I.
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2001
/
p. 2023-2040 : ill
https://www.sciencedirect.com/science/article/pii/S0026271401000920
journal article
23
book article
Representing transparency conditions in test generation for VLSI by decision diagrams
Ubar, Raimund-Johannes
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
1997
/
p. 213-216
book article
24
book
Riistvara kirjeldamiskeel - VHDL : metoodiline materjal
Tammemäe, Kalle
2003
http://www.ester.ee/record=b1605950*est
book
25
book
Riistvara kirjeldamiskeel VHDL : metoodiline materjal
Tammemäe, Kalle
2002
http://www.ester.ee/record=b1605950*est
book
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