Kostin, S., Ubar, R., Gorev, M., Mägi, G.

full record print

Comparison of two approaches to improve functional BIST fault coverage

author

Kostin, Sergei

Ubar, Raimund-Johannes

Gorev, Maksim

Mägi, Gunnar

statement of authorship

Sergei Kostin, Raimund Ubar, Maksim Gorev, Gunnar Mägi

source

BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia

location of publication

Tallinn

publisher

Tallinn University of Technology

year of publication

2014

pages

p. 105-108 : ill

conference name, date

BEC 2014 : 14th Biennial Baltic Electronics Conference, October 6-8, 2014

conference location

Tallinn University of Technology

ISSN

1736-3705

ISBN

978-9949-23-672-5

notes

Bibliogr.: 26 ref

TalTech department

arvutitehnika instituut

language

inglise

Märksõnad ja võtmesõnad

subject term

digitaaltehnika

teimimine

keyword

functional BIST

hybrid BIST

design for testability

controllability

test point insertion

Kostin, S., Ubar, R., Gorev, M., Mägi, G. Comparison of two approaches to improve functional BIST fault coverage // BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2014. p. 105-108 : ill.