Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors
statement of authorship
Raimund Ubar, Fabian Luis Vargas, Maksim Jenihhin, Jaan Raik
source
MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013
location of publication
[S.l.]
year of publication
pages
[1] p
conference name, date
MEDIAN Workshop on Circuit Reliability: Modeling and Monitoring, February 25, 2013
conference location
Rome, Italy
subject term
TTÜ department
language
inglise
Ubar, R., Vargas, F.L., Jenihhin, M., Raik, J. Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors // MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013. [S.l.], 2013. [1] p.