Test pattern generation at the behavioral level from VHDL circuit description containing several processes
author
statement of authorship
Elena Gramatova, Jana Bezakova, Tatiana Cibakova
location of publication
[Tallinn]
year of publication
pages
p. 145-148
subject term
ISBN
9985-59-026-0
notes
Bibl. 14 ref
language
inglise
Gramatova, E., Bezakova, J., Cibakova, T.* Test pattern generation at the behavioral level from VHDL circuit description containing several processes // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 145-148.