Fast fault simulation for extended class of faults in scan-path circuits
statement of authorship
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman
source
Proceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam
location of publication
Los Alamitos
publisher
year of publication
pages
p. 14-19
conference name, date
Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010
conference location
Ho Chi Minh City, Vietnam
ISBN
978-0-7695-3978-2
notes
Bibliogr.: 42 ref
language
inglise
Ubar, R., Devadze, S., Raik, J., Jutman, A. Fast fault simulation for extended class of faults in scan-path circuits // Proceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam. Los Alamitos : IEEE, 2010. p. 14-19.