An approach to model development for embedded testing
author
Timohovich, E.
statement of authorship
E.Timohovich
location of publication
Tallinn
year of publication
pages
p. 353-358
ISBN
9985-59-012-0
notes
Bibl. 17 ref
Timohovich, E. An approach to model development for embedded testing // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 353-358.