Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods
statement of authorship
Jaan Raik, Artur Jutman, Raimund Ubar
source
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II
location of publication
Piscataway
publisher
year of publication
pages
p. 445-448 : ill
conference name, date
9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, September 15-18, 2002
conference location
Dubrovnik, Croatia
ISBN
0-7803-7596-3
notes
Bibliogr.: 7 ref
TTÜ department
language
inglise
subject term
Raik, J., Jutman, A., Ubar, R.-J. Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods // The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II. Piscataway : IEEE, 2002. p. 445-448 : ill.