Ubar, R., Kuchcinski, K. - TalTech Research Portal

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Functional level testability analysis for digital circuits

author

Ubar, Raimund-Johannes

Kuchcinski, Ktzysztof

statement of authorship

Raimund Ubar, Krzysztof Kuchcinski

source

ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993

location of publication

Rotterdam

year of publication

1993

pages

p. 545-546

notes

Bibl. p. 546

language

inglise

Märksõnad ja võtmesõnad

subject term

digitaalelektroonika

analüüs

Ubar, R., Kuchcinski, K. Functional level testability analysis for digital circuits // ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993. Rotterdam, 1993. p. 545-546.