Off-line testing of crosstalk induced glitch faults in NoC Interconnects
statement of authorship
Tomas Bengtsson, Shashi Kumar, Raimund Ubar, Artur Jutman
location of publication
[S.l.]
publisher
year of publication
pages
p. 221-225 : ill
conference name, date
24th IEEE Norchip Conference, 20-21 November, 2006
conference location
Linköping, Sweden
ISBN
1-4244-0772-9
notes
Bibliogr.: 9 ref
TTÜ department
language
inglise
subject term
Bengtsson, T., Kumar, S., Ubar, R.-J., Jutman, A. Off-line testing of crosstalk induced glitch faults in NoC Interconnects // Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006. [S.l.] : IEEE, 2006. p. 221-225 : ill.