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Marginal PCB assembly defect detection on DDR3/4 memory bus

author
Odintsov, Sergei
Jutman, Artur
Devadze, Sergei
statement of authorship
Sergei Odintsov, Artur Jutman and Sergei Devadze
source
2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 2017
location of publication
Piscataway
publisher
IEEE
year of publication
2017
pages
p. 238-247 : ill
conference name, date
48th International Test Conference (ITC), 31 October - 2 November 2017
conference location
Fort Worth, USA
url
https://doi.org/10.1109/TEST.2017.8242070
subject term
tarkvaraarendus
rikked
mäluseadmed
Scopus
Conference proceedings at Scopus
Article at Scopus
WOS
Article at WOS
kvartiil
Q3
category (general)
Mathematics
Engineering
category (sub)
Mathematics. Applied mathematics
Engineering. Electrical and electronic engineering
ISSN
1089-3539
ISBN
978-1-5386-3414-1
notes
Bibliogr.: 20 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
arvutisüsteemide instituut
language
inglise
Odintsov, S., Jutman, A., Devadze, S. Marginal PCB assembly defect detection on DDR3/4 memory bus // 2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 2017. Piscataway : IEEE, 2017. p. 238-247 : ill. https://doi.org/10.1109/TEST.2017.8242070