Pattern based analysis of fractal manufacturing systems [Electronic resource]
autor
vastutusandmed
K. Jääger, J. Vain
allikas
INCOM 2004 : 11th IFAC Symposium on Information Control Problems in Manufacturing : Salvador, Brasil, April 5-7, 2004 : preprints proceedings
ilmumiskoht
[S.l.]
kirjastus/väljaandja
Gulf Professional Publishing
ilmumisaasta
leheküljed
[6] p. [CD-ROM]
konverentsi nimetus, aeg
11th IFAC Symposium on Information Control Problems in Manufacturing, April 5-7, 2004
konverentsi toimumispaik
Salvador, Brasil
keel
inglise
Jääger, K., Vain, J. Pattern based analysis of fractal manufacturing systems [Electronic resource] // INCOM 2004 : 11th IFAC Symposium on Information Control Problems in Manufacturing : Salvador, Brasil, April 5-7, 2004 : preprints proceedings. [S.l.] : Gulf Professional Publishing, 2005. [6] p. [CD-ROM].