prindi

Pattern based analysis of fractal manufacturing systems [Electronic resource]

autor
Jääger, Kadi
Vain, Jüri
vastutusandmed
K. Jääger, J. Vain
allikas
INCOM 2004 : 11th IFAC Symposium on Information Control Problems in Manufacturing : Salvador, Brasil, April 5-7, 2004 : preprints proceedings
ilmumiskoht
[S.l.]
kirjastus/väljaandja
Gulf Professional Publishing
ilmumisaasta
2005
leheküljed
[6] p. [CD-ROM]
konverentsi nimetus, aeg
11th IFAC Symposium on Information Control Problems in Manufacturing, April 5-7, 2004
konverentsi toimumispaik
Salvador, Brasil
leitav
https://www.sciencedirect.com/science/article/pii/S1474667017361529
märksõna
tootmissüsteemid
mudelid
kontroll
analüüs
keel
inglise
Jääger, K., Vain, J. Pattern based analysis of fractal manufacturing systems [Electronic resource] // INCOM 2004 : 11th IFAC Symposium on Information Control Problems in Manufacturing : Salvador, Brasil, April 5-7, 2004 : preprints proceedings. [S.l.] : Gulf Professional Publishing, 2005. [6] p. [CD-ROM]. https://www.sciencedirect.com/science/article/pii/S1474667017361529