Measurement of charge carrier lifetime temperature dependence in 4H-SiC power diodes
autor
Velmre, Enn
Udal, Andres
vastutusandmed
A. Udal, Enn Velmre
allikas
Abstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA
ilmumiskoht
[S.l.]
ilmumisaasta
1999
leheküljed
paper no 394, 2 p
leitav
https://www.researchgate.net/publication/240833834_Measurement_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Power_Diodes
märksõna
dioodid
ränikarbiid
temperatuur
eluiga
mõõtmine
TTÜ struktuuriüksus
elektroonikainstituut
keel
inglise