Computer aided method for measurement of reflection and impedance characteristics of RF devices
autor
Asovich, P.L.
Zhukov, S.A.
Ivanyuhin V.I.
vastutusandmed
Asovich P.L., Zhukov S.A. and Ivanyuhin V.I
allikas
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section A. Section M / Tallinn Technical University
ilmumiskoht
Tallinn
ilmumisaasta
leheküljed
p. 122-127: ill
märkused
Bibl. 2 ref
retsensioon
Kokkuvõte: Kõrgsagedusseadiste impedantsi ja peegelduste automatiseeritud mõõtmismeetod
keel
inglise
Asovich, P.L., Zhukov, S.A., Ivanyuhin V.I. Computer aided method for measurement of reflection and impedance characteristics of RF devices // Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section A. Section M / Tallinn Technical University. Tallinn, 1992. p. 122-127: ill.