Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource]
autor
Kropman, Daniel
Kärner, T.
Abru, Uno
Ugaste, Ülo
Mellikov, Enn
vastutusandmed
D.Kropman, T.Kärner, U.Abru, Ü.Ugaste, E.Mellikov
allikas
Proceedings IVC-16 : Venice, 2004
ilmumisaasta
2004
leheküljed
p. SS1-TuP394 [CD-ROM]
leitav
https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties
märksõna
punktdefektid
elektroni paramagnetresonantsspektroskoopia
tuumamagnetresonants
räni
ränioksiid
keel
inglise