AFM and SEM investigations of ion beam synthesized Mg2Si precipitates in Si substrates
vastutusandmed
Ch.Angelov, V.Mikli, B.Amov, E.Goranova
ajakirja aastakäik number kuu
Vol. 7
ilmumisaasta
leheküljed
1, p. 369-373
keel
inglise
Angelov, Ch., Mikli, V., Amov, B., Goranova, E.* AFM and SEM investigations of ion beam synthesized Mg2Si precipitates in Si substrates // Journal of optoelectronics and advanced materials (2005) Vol. 7, 1, p. 369-373. https://old.joam.inoe.ro/arhiva/pdf7_1/Angelov3.pdf