prindi

Analysis of trace amounts of metal ions using silica-based chelating resins : a green analytical method

autor
Sharma, Rakesh Kumar
Mittal, Sachin
Koel, Mihkel
vastutusandmed
Rakesh Kumar Sharma, Sachin Mittal, and Mihkel Koel
allikas
Critical reviews in analytical chemistry
ajakirja aastakäik number kuu
Vol. 33
ilmumisaasta
2003
leheküljed
3, p. 183-197
leitav
https://www.tandfonline.com/doi/abs/10.1080/713609163
märksõna
silikageelid
kelaadid
eraldamine
metallid
ioonid
ISSN
1040-8347
märkused
Bibliogr.: 59 ref
keel
inglise
Sharma, R.K., Mittal, S., Koel, M. Analysis of trace amounts of metal ions using silica-based chelating resins : a green analytical method // Critical reviews in analytical chemistry (2003) Vol. 33, 3, p. 183-197. https://www.tandfonline.com/doi/abs/10.1080/713609163