prindi

A critical study of semiconductor device simulation methods

autor
Tarnay, K.
vastutusandmed
K.Tarnay
allikas
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1998
leheküljed
p. 9-16: ill
märksõna
elektroonika
pooljuhtseadised
vormimärksõna
konverentsid
ISBN
9985-59-081-3
märkused
Bibl. 6 ref
Tarnay, K. A critical study of semiconductor device simulation methods // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 9-16: ill.