Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource]
vastutusandmed
Andrei Blinov, Staffan Norrga and Gabriel Tibola
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 1-9 : ill. [USB]
konverentsi nimetus, aeg
17th European Conference on Power Electronics and Applications, EPE 2015 ECCE Europe, 8-10 September, 2015
konverentsi toimumispaik
Geneva, Switzerland
märksõna
võtmesõna
device characterisation
ISBN
9789075815238
märkused
Bibliogr.: 7 ref
CERN = European Organization for Nuclear Research
TTÜ struktuuriüksus
keel
inglise
Blinov, A., Norrga, S., Tibola, G. Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource] // EPE'15 ECCE Europe : 8-10 September 2015, Geneva, Switzerland : 17th European Conference on Power Electronics and Applications. [S.l.] : CERN, 2015. p. 1-9 : ill. [USB].