XPS study of OH impurity in solution processed CdS thin films

vastutusandmed
Natalia Maticiuc, Atanas Katerski, Mati Danilson, Malle Krunks, Jaan Hiie
ajakirja aastakäik number kuu
vol. 160
ilmumisaasta
leheküljed
p. 211-216 : ill
võtmesõna
CdS thin film
hydroxide incorporation
mechanism of changes in CdS properties
ISSN
0927-0248
märkused
Bibliogr.: 34 ref
keel
inglise
Maticiuc, N., Katerski, A., Danilson, M., Krunks, M., Hiie, J. XPS study of OH impurity in solution processed CdS thin films // Solar energy materials and solar cells (2017) vol. 160, p. 211-216 : ill. http://dx.doi.org/10.1016/j.solmat.2016.10.040