Otsing - TalTech teadusportaal

artikkel kogumikus

Calculation of LFSR seed and polynomial pair for BIST applications [Electronic resource]Jutman, Artur; Tšertov, Anton; Ubar, Raimund-Johannes2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 275-279 : ill. [CD-ROM]

artikkel kogumikus

Code coverage analysis using high-level decision diagrams [Electronic resource]Raik, Jaan; Reinsalu, Uljana; Ubar, Raimund-Johannes; Jenihhin, Maksim; Ellervee, Peeter2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 201-207 : ill. [CD-ROM]

artikkel kogumikus

Web-based framework for parallel distributed test [Electronic resource]Ivask, Eero; Raik, Jaan; Ubar, Raimund-Johannes2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 271-274 : ill. [CD-ROM]

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2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008 (allikas)

teaviku laadid

CV 22

tema kohta 14

võtmesõna 4

märksõna 3