TMS320F28069-based impedance spectroscopy with binary excitation

vastutusandmed
M. Rist, M. Reidla, M. Min, T. Parve, O. Martens, R. Land
ilmumiskoht
Amsterdam
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 217-220
konverentsi nimetus, aeg
EDERC 2012, 5th European DSP in Education & Research Conference, 13-14 September, 2012
konverentsi toimumispaik
Amsterdam, The Netherlands
ISBN
978-0-9573832-0-3
keel
inglise
Rist, M., Reidla, M., Min, M., Parve, T., Märtens, O., Land, R. TMS320F28069-based impedance spectroscopy with binary excitation // EDERC 2012 : proceedings of the 5th European DSP in Education & Research Conference : 13-14 September 2012, Amsterdam, The Netherlands. Amsterdam : Texas Instruments, 2012. p. 217-220. https://ieeexplore.ieee.org/document/6532258