Otsing - TalTech teadusportaal

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1

artikkel kogumikus

Comparison of spectrally sparse excitation signals for fast bioimpedance spectroscopy : in the context of cytometryOjarand, Jaan; Land, Raul; Min, MartMeMeA 2012 IEEE International Symposium on Medical Measurements and Applications : proceedings : May 18-19, 2012, Budapest, Hungary2012 / 5 p. : ill https://ieeexplore.ieee.org/document/6226631

artikkel kogumikus

2

artikkel kogumikus

Controllable limiter of signal amplitudes for bioimpedance measurementsOjarand, Jaan; Min, MartEMBEC & NBC 2017 : joint conference of the European Medical and Biological Engineering Conference (EMBEC) and the Nordic-Baltic Conference on Biomedical Engineering and Medical Physics (NBC), Tampere, Finland, June 20172018 / p. 920-923 : ill https://doi.org/10.1007/978-981-10-5122-7_230

artikkel kogumikus

3

artikkel ajakirjas

Crest factor optimization of the multisine waveform for bioimpedance spectroscopyOjarand, Jaan; Min, Mart; Annus, PaulPhysiological measurement2014 / p. 1019-1033 : ill

artikkel ajakirjas

4

artikkel kogumikus

Enhanced optimization of the wideband excitation signal for a bioimpedance measurementOjarand, Jaan; Rist, Marek; Min, Mart2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2015) : May 11-14, 2015, Pisa, Italy : proceedings2015 / p. 1801-1806 : ill http://dx.doi.org/10.1109/I2MTC.2015.7151554

artikkel kogumikus

5

artikkel kogumikus

Multisine and binary multifrequency waveforms in impedance spectrum measurement : a comparative studyAnnus, Paul; Min, Mart; Ojarand, Jaan; Paavle, Toivo; Land, Raul; Ellervee, Peeter; Parve, Toomas5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary2012 / p. 1265-1268 https://link.springer.com/chapter/10.1007/978-3-642-23508-5_327

artikkel kogumikus

6

artikkel ajakirjas EST / artikkel ajakirjas ENG

Recent advances in crest factor minimization of multisineOjarand, Jaan; Min, MartElektronika ir elektrotechnika = Electronics and electrical engineering2017 / p. 59-62 : ill https://doi.org/10.5755/j01.eie.23.2.18001 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

crest factor (võtmesõna)

teaviku laadid

võtmesõna 86