Techn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwäbisch Gmünd, Germany (allikas)

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    Numerical simulation of electrothermal effects in ESD protection devicesHellstrom, S.; Freidin, Boris; Velmre, Enn; Udal, AndresTechn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwäbisch Gmünd, Germany1992 / p. 77-80 https://d-nb.info/921228503/04
    artikkel kogumikus
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