In-situ characterization of the polypyrrole films by QCM and CER techniques
vastutusandmed
V.Syritski, A.Öpik, A.Talo, O.Forsen
ilmumiskoht
Amsterdam
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 122-WedA121
keel
inglise
Sõritski, V., Öpik, A., Talo, A., Forsen, O. In-situ characterization of the polypyrrole films by QCM and CER techniques // International Conference on Science and Technology of Synthetic Metals : 15th to 21st of July 2000, Gastein, Austria : book of abstracts. Amsterdam : Elsevier, 2000. p. 122-WedA121. https://research.aalto.fi/fi/publications/in-situ-characterization-of-the-polypyrrole-films-by-qcm-and-cer-