Measurement of transistor low frequency noise source parameters

vastutusandmed
M.Zeltinš, I.Slaidinš
ilmumiskoht
[Tallinn]
ilmumisaasta
leheküljed
p. 475-478: ill
ISBN
9985-59-026-0
märkused
Bibl. 4 ref
Zeltinš, M., Slaidinš, I.* Measurement of transistor low frequency noise source parameters // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 475-478: ill.