Mixed-level defect simulation in data-paths of digital systems
author
Ubar, Raimund-Johannes
Raik, Jaan
Ivask, Eero
Brik, Marina
statement of authorship
R.Ubar, J.Raik, E.Ivask, M.Brik
source
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
location of publication
[S.l.]
publisher
IEEE Electron Devices Society
year of publication
2002
pages
p. 617-620 : ill
ISBN
0-7803-7235-2
notes
Bibliogr.: 8 ref