Hierarchical analysis of short defects between metal lines in CMOS IC
author
statement of authorship
Witold A.Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz
source
Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy
location of publication
Los Alamitos
publisher
year of publication
pages
p. 729-734 : ill
ISBN
978-0-7695-3277-6
notes
Bibliogr.: 19 ref
Pleskacz, W.A., Jenihhin, M., Raik, J., Rakowski, M., Ubar, R.-J., Kuzmicz, W. Hierarchical analysis of short defects between metal lines in CMOS IC // Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy. Los Alamitos : IEEE Computer Society, 2008. p. 729-734 : ill.