Active redundancy in fault tolerance : A modular switch level solution with synchronous switching
                                            statement of authorship
                                    
                                    
Aditya Shirodkar, Satish Naik Banavath, Andrii Chub, Riccardo Mandrioli, Mattia Ricco
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
6 p
                                                    
                                            
                                            conference name, date
                                    
                                    
7th IEEE International Conference on DC Microgrids (ICDCM 2025), June 4 - 6, 2025
                                                    
                                            
                                            conference location
                                    
                                    
Tallinn, Estonia
                                                    
                                            
                                            ISBN
                                    
                                    
979-8-3315-1275-0
                                                    
                                            
                                            scientific publication
                                    
                                    
teaduspublikatsioon
                                                    
                                            
                                            TalTech department
                                    
                                    
                                
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            classifier
                                    
                                    
                                
                                    Shirodkar, A., Banavath, S. N., Chub, A., Mandrioli, R., Ricco, M. Active redundancy in fault tolerance : A modular switch level solution with synchronous switching // 2025 IEEE Seventh International Conference on DC Microgrids (ICDCM). : IEEE, 2025. 6 p.