Active redundancy in fault tolerance : A modular switch level solution with synchronous switching
statement of authorship
Aditya Shirodkar, Satish Naik Banavath, Andrii Chub, Riccardo Mandrioli, Mattia Ricco
publisher
year of publication
pages
6 p
conference name, date
7th IEEE International Conference on DC Microgrids (ICDCM 2025), June 4 - 6, 2025
conference location
Tallinn, Estonia
ISBN
979-8-3315-1275-0
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
classifier
Shirodkar, A., Banavath, S. N., Chub, A., Mandrioli, R., Ricco, M. Active redundancy in fault tolerance : A modular switch level solution with synchronous switching // 2025 IEEE Seventh International Conference on DC Microgrids (ICDCM). : IEEE, 2025. 6 p.