Implementation-independent functional test generation for RISC microprocessors
author
Oyeniran, Adeboye Stephen
Ubar, Raimund-Johannes
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
source
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
location of publication
Piscataway
publisher
IEEE
year of publication
2019
pages
p. 82-87 : ill
conference name, date
27th IFIP/IEEE International Conference on Very Large Scale Integration, October 6-9, 2019
conference location
Cusco, Peru
url
https://doi.org/10.1109/VLSI-SoC.2019.8920323
subject term
mikroprotsessorid
testimine
rikked
tarkvara
keyword
microprocessor testing
high-level functional fault model
test generation
high-level fault coverage
fault redundancy
ISSN
2324-8440
2324-8432
ISBN
978-1-7281-3915-9
978-1-7281-3916-6
notes
Bibliogr.: 34 ref
TalTech department
arvutisüsteemide instituut
language
inglise