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test generation (keyword)
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1
book article
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
book article
2
book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
3
book article
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
book article
4
book article EST
/
book article ENG
GUARD: An ABC-GA hybrid approach utilizing mAchine LeaRning and dimensionality reduction for hardware Trojan detection
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Bagheri, Foad
;
Ghasempouri, Tara
2025 IEEE East-West Design & Test Symposium (EWDTS)
2025
/
8 p
http://doi.org/10.1109/EWDTS67441.2025.11303691
book article EST
/
book article ENG
5
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
6
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
7
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
8
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
9
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
10
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
11
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
12
book article EST
/
book article ENG
PATROL: an evolutionary APproach to Automatic Test Pattern Generation for hardware TROjan detection leveraging PSO-GA hybrid techniques
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Ghasempouri, Tara
Proceedings of the 2024 IEEE 33rd Asian Test Symposium : ATS 2024 : Ahmedabad, India, 17-20 December 2024
2024
/
6 p.
https://doi.org/10.1109/ATS64447.2024.10915294
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
13
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
14
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
15
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
16
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 16, displaying
1 - 16
keyword
224
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automated code generation
20.
automatic code generation
21.
Automatic generation control
22.
automatic GUI model generation
23.
building and urban form generation
24.
business model generation
25.
code generation
26.
data set generation
27.
decentralized key generation
28.
disaster alert generation
29.
distributed electricity generation
30.
distributed generation
31.
Distributed Generation (DG)
32.
distributed generation systems
33.
distributed power generation
34.
distrubuted power generation
35.
droplet generation
36.
droplet generation rate control
37.
electric power generation
38.
electricity generation
39.
energy generation
40.
extreme penetration level of non synchronous generation
41.
feasible path generation
42.
fifth generation computer
43.
food waste generation
44.
fourth generation district heating
45.
frequent item generation
46.
generation
47.
generation and transmission expansion planning
48.
Generation Costs
49.
generation of electric energy
50.
generation scheduling
51.
generation succession
52.
heat generation
53.
hydroelectric power generation
54.
hydrogen generation
55.
I–III generation
56.
job generation
57.
knowledge generation
58.
multisine generation
59.
next generation 4D printing
60.
next generation sequencing
61.
Next-generation probiotics
62.
next-generation sequencing
63.
oil-shale power generation
64.
pattern Generation
65.
photovoltaic (PV) generation
66.
photovoltaic generation dispatch
67.
power generation
68.
power generation dispatch
69.
power generation economics
70.
power generation planning
71.
PV generation
72.
PV power generation
73.
Renewable energy generation
74.
renewable generation
75.
residual generation
76.
rule generation
77.
Scenario Generation
78.
Second generation bioethanol
79.
second generation of tribology models
80.
second generation sequencing
81.
signal generation
82.
silver generation
83.
sixth-generation (6G)
84.
solar power generation
85.
space generation advisory council
86.
template based sql generation
87.
trajectory generation
88.
waste generation
89.
wave generation
90.
WEEE generation
91.
white light generation
92.
wind energy generation
93.
wind generation
94.
wind power generation
95.
16S rRNA gene amplicon next-generation sequencing
96.
4GDH (4th generation district heating)
97.
4th generation district heating
98.
5th generation district heating
99.
accelerated shelf-life test
100.
antigen test
101.
Applications in Test Engineering
102.
ASTM G65 dry sand rubber wheel abrasion test
103.
Automated Synthesis of Software-based Self-test
104.
automated test environment
105.
Auvergne test-bed
106.
battery test
107.
behavioral test
108.
bending test
109.
bit-error rate test
110.
Board and System Test
111.
board test
112.
bounds test
113.
built-in self-test
114.
capillary condensation redistribution test
115.
chi-square test
116.
closed bottle test
117.
cognitive screening test
118.
compartment fire test
119.
compartment test
120.
cone penetration test (CPT)
121.
COVID-19 antigen test
122.
cutting test
123.
cybersecurity test bed
124.
DDR4 interconnect test
125.
design and test
126.
design-for-test
127.
deterministic test sequences
128.
diagnostic test
129.
digital test
130.
Digital test and testable design
131.
double-pulse test
132.
drawing test
133.
dry droplet antimicrobial test
134.
embedded test
135.
fan pressurisation test
136.
final test result prediction
137.
four-point bending test
138.
FPGA based test
139.
FPGA-Assisted Test
140.
FPGA-centric test
141.
functional self-test
142.
Granger causality test
143.
hardness test
144.
high-level synthesis for test
145.
high-speed serial link test
146.
IEEE 9 bus test system
147.
in situ tensile test in SEM
148.
industrial field test
149.
in-situ tensile test in SEM
150.
Johansen cointegration test
151.
Kolmogorov-Smirnov test
152.
load test
153.
logic built-in self-test
154.
Luria alternating series test
155.
Mann–Kendall test
156.
Mann-Kendall trend test
157.
memory interconnect test
158.
microprocessor test
159.
Model test
160.
multiplier test
161.
orthogonal test
162.
package test analysis
163.
parallel design and test
164.
performance test
165.
piezocone penetration test (CPTu)
166.
Point Load Test index
167.
pressurisation test
168.
processor-centric board test
169.
progressive damage test
170.
pseudo-exhaustive test
171.
purity test
172.
real-time room temperature test
173.
rolling thin film oven test
174.
rtioco-based timed test sequences
175.
seasonal Mann Kendall test
176.
seismic piezocone penetration test
177.
self-test
178.
self-test architectures
179.
sentence writing test
180.
serial sevens test
181.
ship towing test tank
182.
similar material simulation test
183.
small-scale fire test
184.
small‐scale test
185.
software based self-test
186.
software-based self-test
187.
software-based self-test (SBST)
188.
soil phosphorus (P) test
189.
standard test method
190.
static load test
191.
static-dynamic probing test (SDT)
192.
stress test
193.
system level test
194.
teaching design and test of systems
195.
tensile test
196.
tensile test
197.
test
198.
test and evaluation platform
199.
test automation
200.
test bench
201.
test coverage
202.
test driven development
203.
test driven modelling
204.
test embankment
205.
test equipment
206.
test groups
207.
test model design
208.
test optimization
209.
test packets
210.
test path synthesis
211.
test patterns
212.
test point insertion
213.
test reference year
214.
test replication
215.
test scenario description language
216.
test-bed
217.
test-chips
218.
test-house
219.
test-pattern
220.
test-suite reduction
221.
Three-point bending test
222.
unit root test
223.
usability platform test
224.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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