Statistical Analysis-Based Feature Selection for Anomaly Detection in AIS Dataset
statement of authorship
Gabor Visky, Risto Vaarandi, Sokratis Katsikas, Olaf Maennel
source
2025 IEEE 23rd World Symposium on Applied Machine Intelligence and Informatics (SAMI)
publisher
year of publication
pages
p. 000159-000164
conference name, date
2025 IEEE 23rd World Symposium on Applied Machine Intelligence and Informatics (SAMI), 23-25 Jan. 2025
conference location
Stará Lesná, Slovakia
ISSN
2767-9438
ISBN
979-8-3503-7936-5
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
classifier
Visky, G., Vaarandi, R., Katsikas, S., Maennel, O. Statistical Analysis-Based Feature Selection for Anomaly Detection in AIS Dataset // 2025 IEEE 23rd World Symposium on Applied Machine Intelligence and Informatics (SAMI). : IEEE, 2025. p. 000159-000164.