Automatic test generation system for VLSI
statement of authorship
G. Jervan, A. Markus, J. Raik, R. Ubar
location of publication
[S.l.]
year of publication
pages
p. 255-258
subject term
language
inglise
Jervan, G., Markus, A., Raik, J., Ubar, R. Automatic test generation system for VLSI // Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997. [S.l.], 1997. p. 255-258.