Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
author
Oyeniran, Adeboye Stephen
Azad, Siavoosh Payandeh
Ubar, Raimund-Johannes
statement of authorship
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
source
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
location of publication
Piscataway
publisher
IEEE
year of publication
2018
pages
5 p.: ill
conference name, date
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 27-30 May, 2018
conference location
Florence, Italy
url
https://doi.org/10.1109/ISCAS.2018.8350936
subject term
mikroprotsessorid
testimine
arvuti arhitektuur
riistvara
Scopus
https://www.scopus.com/sourceid/56190
https://www.scopus.com/record/display.uri?eid=2-s2.0-85057101928&origin=inward&txGid=49e361500f6fe5902264fae2d90ceb95
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:000451218700050
quartile
Q3
category (general)
Engineering
Tehnika
category (sub)
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
subject of form
konverentsikogumikud
keyword
circuit faults
adders
built-in self-test
microprocessors
computer architecture
hardware
ISBN
978-1-5386-4881-0
notes
Bibliogr.: 28 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems