Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
author
Oyeniran, Adeboye Stephen
Azad, Siavoosh Payandeh
Ubar, Raimund-Johannes
statement of authorship
Adeboye Stephen Oyeniran, Siavoosh Payandeh Azad, Raimund Ubar
source
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
location of publication
Piscataway
publisher
IEEE
year of publication
2018
pages
5 p.: ill
conference name, date
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 27-30 May, 2018
conference location
Florence, Italy
url
https://doi.org/10.1109/ISCAS.2018.8350936
subject term
mikroprotsessorid
testimine
arvuti arhitektuur
riistvara
Scopus
Conference proceedings at Scopus
Article at Scopus
WOS
Article at WOS
kvartiil
Q3
category (general)
Engineering
en
Tehnika
et
category (sub)
Engineering. Electrical and electronic engineering
en
Tehnika. Elektri- ja elektroonikatehnika
et
subject of form
konverentsikogumikud
keyword
circuit faults
adders
built-in self-test
microprocessors
computer architecture
hardware
ISBN
978-1-5386-4881-0
notes
Bibliogr.: 28 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems