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1
book article
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
book article
2
book article
Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal
2007
/
[7] p. : ill. [CD-ROM]
http://icee2007.dei.uc.pt/proceedings/papers/429.pdf
book article
3
journal article
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
http://dx.doi.org/10.1016/j.micpro.2014.11.002
journal article
4
book article EST
/
book article ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
5
book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
6
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
7
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 7, displaying
1 - 7
keyword
225
1.
built-in self-test
2.
logic built-in self-test
3.
functional self-test
4.
self-test
5.
self-test architectures
6.
software based self-test
7.
software-based self-test
8.
software-based self-test (SBST)
9.
As-built
10.
built environment
11.
built environment and architecture
12.
built environment investment
13.
built environment skills needs
14.
built in moisture
15.
built-in moisture
16.
Built-in transformer (BIT)
17.
cultural built heritage
18.
sustainable built environment
19.
association of local-self government
20.
association of local-self governments
21.
corporate energy self-sufficiency
22.
diffusion and self-trapping of charge carriers
23.
digital self-determination
24.
digital self-efficacy
25.
digital self-interference cancellation
26.
European charter of local self-government
27.
European self-sovereign identity framework
28.
income of self-employed
29.
increased self-consumption
30.
local self-government
31.
nikel-based self-fluxing alloy
32.
NiP self-lubricating coating
33.
open self‐ventilated machines
34.
optical self-mixing
35.
OSV (open self‐ventilated) machines
36.
perceived general self-efficacy
37.
Self assessment tool
38.
self aware
39.
self learning software
40.
self learning system
41.
Self organization
42.
self organizing map
43.
self organizing network
44.
self regulating heating
45.
self regulation
46.
self-analysis
47.
self-assembled monolayers
48.
self-assembly
49.
self-assessed quality of life
50.
self-assessment
51.
self-assessment tool
52.
self-aware contracts
53.
self-aware systems
54.
self-awareness
55.
self-checking
56.
self-cleaning surfaces
57.
self-consumption
58.
self-costs
59.
self-defence
60.
self-determination theory
61.
self-determination theory of work motivation
62.
self-development
63.
self-driving car
64.
self-driving cars
65.
self-driving minibus
66.
self-driving vehicle
67.
self-driving vehicles
68.
self-efficacy
69.
self-employed
70.
self-employment
71.
self-evaluation
72.
self-fluxing alloy
73.
self-governance
74.
self-healing
75.
self-heating phenomenon
76.
self-identification
77.
self-identity
78.
self-improvement
79.
self-insurance
80.
self-learning
81.
self-lubrication
82.
self-management
83.
self‐management
84.
self-mixing
85.
self-organisation
86.
self-organised teams
87.
self-organization
88.
self-organized criticality
89.
self-organized teams
90.
self-perforating dowel
91.
self-propagating high temperature synthesized (SHS)
92.
Self-Propagating High-Temperature Synthesis
93.
self-propulsion
94.
self-regulated learning
95.
self-regulation
96.
self-reported musculoskeletal disorders
97.
self-rolling
98.
self-shading envelopes
99.
self-study
100.
self-study courses
101.
social self-development
102.
accelerated shelf-life test
103.
adaptive test strategy generation
104.
antigen test
105.
ASTM G65 dry sand rubber wheel abrasion test
106.
automated test environment
107.
automated test pattern generation
108.
automatic test case generation
109.
automatic test pattern generation
110.
automatic test program generation
111.
Auvergne test-bed
112.
battery test
113.
behavioral test
114.
behaviour level test generation
115.
bending test
116.
bit-error rate test
117.
Board and System Test
118.
board test
119.
bounds test
120.
capillary condensation redistribution test
121.
chi-square test
122.
closed bottle test
123.
cognitive screening test
124.
compartment fire test
125.
compartment test
126.
cone penetration test (CPT)
127.
COVID-19 antigen test
128.
cutting test
129.
cybersecurity test bed
130.
DDR4 interconnect test
131.
design and test
132.
design-for-test
133.
deterministic test sequences
134.
diagnostic test
135.
digital test
136.
Digital test and testable design
137.
double-pulse test
138.
drawing test
139.
dry droplet antimicrobial test
140.
embedded test
141.
fan pressurisation test
142.
final test result prediction
143.
four-point bending test
144.
FPGA based test
145.
FPGA-Assisted Test
146.
FPGA-centric test
147.
functional test generation
148.
Granger causality test
149.
hardness test
150.
high-level synthesis for test
151.
high-level test data generation
152.
highlevel test generation
153.
high-speed serial link test
154.
IEEE 9 bus test system
155.
implementation-independent test generation
156.
in situ tensile test in SEM
157.
industrial field test
158.
in-situ tensile test in SEM
159.
Johansen cointegration test
160.
Kolmogorov-Smirnov test
161.
load test
162.
Luria alternating series test
163.
Mann–Kendall test
164.
memory interconnect test
165.
microprocessor test
166.
Model test
167.
multiplier test
168.
offline test generation
169.
orthogonal test
170.
package test analysis
171.
parallel design and test
172.
performance test
173.
piezocone penetration test (CPTu)
174.
Point Load Test index
175.
pressurisation test
176.
processor-centric board test
177.
progressive damage test
178.
provably correct test generation
179.
pseudo-exhaustive test
180.
purity test
181.
rtioco-based timed test sequences
182.
seasonal Mann Kendall test
183.
seismic piezocone penetration test
184.
sentence writing test
185.
serial sevens test
186.
ship towing test tank
187.
similar material simulation test
188.
small‐scale test
189.
soil phosphorus (P) test
190.
standard test method
191.
static load test
192.
static-dynamic probing test (SDT)
193.
stress test
194.
system level test
195.
teaching design and test of systems
196.
tensile test
197.
test
198.
test and evaluation platform
199.
test bench
200.
test coverage
201.
test driven development
202.
test driven modelling
203.
test embankment
204.
test equipment
205.
test generation
206.
test generation and fault diagnosis
207.
test groups
208.
test model design
209.
test optimization
210.
test packets
211.
test path synthesis
212.
test patterns
213.
test point insertion
214.
test program generation
215.
test reference year
216.
test replication
217.
test scenario description language
218.
test-bed
219.
test-chips
220.
test-house
221.
test-pattern
222.
test-suite reduction
223.
Three-point bending test
224.
unit root test
225.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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