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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

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3

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. functional self-test
4. self-test
5. self-test architectures
6. software based self-test
7. software-based self-test
8. software-based self-test (SBST)
9. As-built
10. built environment
11. built environment and architecture
12. built environment investment
13. built environment skills needs
14. built in moisture
15. built-in moisture
16. Built-in transformer (BIT)
17. cultural built heritage
18. sustainable built environment
19. adolescent self-efficacy
20. association of local-self government
21. association of local-self governments
22. corporate energy self-sufficiency
23. covalent self-assembly in solid state
24. diffusion and self-trapping of charge carriers
25. digital self-determination
26. digital self-efficacy
27. digital self-interference cancellation
28. European charter of local self-government
29. European self-sovereign identity framework
30. income of self-employed
31. increased self-consumption
32. local self-government
33. nikel-based self-fluxing alloy
34. NiP self-lubricating coating
35. open self‐ventilated machines
36. optical self-mixing
37. OSV (open self‐ventilated) machines
38. perceived general self-efficacy
39. renewables self-consumption
40. Self assessment tool
41. self aware
42. self learning software
43. self learning system
44. Self organization
45. self organizing map
46. self organizing network
47. self regulating heating
48. self regulation
49. self-analysis
50. self-assembled monolayers
51. self-assembly
52. self-assessed quality of life
53. self-assessment
54. self-assessment tool
55. self-aware contracts
56. self-aware systems
57. self-awareness
58. self-checking
59. self-cleaning surfaces
60. self-consumption
61. self-costs
62. self-defence
63. self-determination
64. self-determination theory
65. self-determination theory of work motivation
66. self-development
67. self-driving car
68. self-driving cars
69. self-driving minibus
70. self-driving vehicle
71. self-driving vehicles
72. self-efficacy
73. self-efficacy development
74. self-employed
75. self-employment
76. self-evaluation
77. self-fluxing alloy
78. self-governance
79. self-healing
80. self-heating phenomenon
81. self-identification
82. self-identity
83. self-improvement
84. self-insurance
85. self-learning
86. self-lubrication
87. self-management
88. self‐management
89. self-mixing
90. self-organisation
91. self-organised teams
92. self-organization
93. self-organized criticality
94. self-organized teams
95. self-perforating dowel
96. self-propagating high temperature synthesized (SHS)
97. Self-Propagating High-Temperature Synthesis
98. self-propulsion
99. self-regulated learning
100. self-regulation
101. self-reported musculoskeletal disorders
102. self-rolling
103. self-shading envelopes
104. self-study
105. self-study courses
106. self-training
107. social self-development
108. accelerated shelf-life test
109. adaptive test strategy generation
110. antigen test
111. ASTM G65 dry sand rubber wheel abrasion test
112. automated test environment
113. automated test pattern generation
114. automatic test case generation
115. automatic test pattern generation
116. automatic test program generation
117. Auvergne test-bed
118. battery test
119. behavioral test
120. behaviour level test generation
121. bending test
122. bit-error rate test
123. Board and System Test
124. board test
125. bounds test
126. capillary condensation redistribution test
127. chi-square test
128. closed bottle test
129. cognitive screening test
130. compartment fire test
131. compartment test
132. cone penetration test (CPT)
133. COVID-19 antigen test
134. cutting test
135. cybersecurity test bed
136. DDR4 interconnect test
137. design and test
138. design-for-test
139. deterministic test sequences
140. diagnostic test
141. digital test
142. Digital test and testable design
143. double-pulse test
144. drawing test
145. dry droplet antimicrobial test
146. embedded test
147. fan pressurisation test
148. final test result prediction
149. four-point bending test
150. FPGA based test
151. FPGA-Assisted Test
152. FPGA-centric test
153. functional test generation
154. Granger causality test
155. hardness test
156. high-level synthesis for test
157. high-level test data generation
158. highlevel test generation
159. high-speed serial link test
160. IEEE 9 bus test system
161. implementation-independent test generation
162. in situ tensile test in SEM
163. industrial field test
164. in-situ tensile test in SEM
165. Johansen cointegration test
166. Kolmogorov-Smirnov test
167. load test
168. Luria alternating series test
169. Mann–Kendall test
170. memory interconnect test
171. microprocessor test
172. Model test
173. multiplier test
174. offline test generation
175. orthogonal test
176. package test analysis
177. parallel design and test
178. performance test
179. piezocone penetration test (CPTu)
180. Point Load Test index
181. pressurisation test
182. processor-centric board test
183. progressive damage test
184. provably correct test generation
185. pseudo-exhaustive test
186. purity test
187. rtioco-based timed test sequences
188. seasonal Mann Kendall test
189. seismic piezocone penetration test
190. sentence writing test
191. serial sevens test
192. ship towing test tank
193. similar material simulation test
194. small‐scale test
195. soil phosphorus (P) test
196. standard test method
197. static load test
198. static-dynamic probing test (SDT)
199. stress test
200. system level test
201. teaching design and test of systems
202. tensile test
203. test
204. test and evaluation platform
205. test bench
206. test coverage
207. test driven development
208. test driven modelling
209. test embankment
210. test equipment
211. test generation
212. test generation and fault diagnosis
213. test groups
214. test model design
215. test optimization
216. test packets
217. test path synthesis
218. test patterns
219. test point insertion
220. test program generation
221. test reference year
222. test replication
223. test scenario description language
224. test-bed
225. test-chips
226. test-house
227. test-pattern
228. test-suite reduction
229. Three-point bending test
230. unit root test
231. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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