Jervan, G., Markus, A., Raik, J., Ubar, R.

Hierarchical test generation with multi-level decision diagram models

author

Jervan, Gert

Markus, Antti

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

Gert Jervan, Antti Markus, Jaan Raik, Raimund Ubar

source

Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998

location of publication

[S.l.]

year of publication

1998

pages

p. 26-33

language

inglise

Jervan, G., Markus, A., Raik, J., Ubar, R. Hierarchical test generation with multi-level decision diagram models // Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998. [S.l.], 1998. p. 26-33.