Storojev, S., Leveugle, R., Saucier, G.

full record print

A global methodology for test program generation starting from high level specifications

author

Storojev, Sergei

Leveugle, Regis

Saucier, Gabriele

statement of authorship

Sergei Storojev, Regis Leveugle, Gabriele Saucier

source

BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1

location of publication

Tallinn

year of publication

1994

pages

p. 305-311: ill

conference name, date

BEC : Baltic Electronics Conference, October 9-14, 1994,

conference location

Tallinn (Estonia)

url

https://www.ester.ee/record=b2150914*est

ISBN

9985-59-012-0

notes

Bibl. 4 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

testimine

testid

raalprojekteerimine

integraallülitused

Storojev, S., Leveugle, R., Saucier, G. A global methodology for test program generation starting from high level specifications // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 305-311: ill. https://www.ester.ee/record=b2150914*est